We are using innovative processing to develop novel superconducting materials with enhanced properties for quantum circuit applications. Critical elements for development of these materials are characterization of the material morphology including crystallinity, phases, alloying and intermixing, as well as identification of defects such as cracks and impurities. Equipment available for the project includes a high-resolution X-ray diffractometer, field emission SEMs and an aberration corrected scanning transmission electron microscope with a variety of detectors (HAADF, BF, ABF, XEDS, EELS) as well as holography and tomography capability. Experience in STEM/TEM imaging and microanalysis is preferred.