NRC Research Associate Programs
Fellowships Office
Policy and Global Affairs

Participating Agencies - NIST

  sign inOpen Printer View

Opportunity at National Institute of Standards and Technology (NIST)

Broadband Nanoimaging of Optically Excited Free Carriers


Physical Measurement Laboratory, Applied Physics Division

RO# Location
50.68.62.B5520 Boulder, CO

Please note: This Agency only participates in the February and August reviews.


name email phone
Pavel Kabos 303.497.3997
T. Mitchell Wallis 303.497.5089



The successful design and deployment of next-generation electronic and optoelectronic nanoscale devices will require a detailed understanding of the underlying electronic structure and the electronic response to external stimuli. We seek to understand nanoscale variations in conductivity by leveraging our existing capabilities in AFM-based microwave impedance microscopy (sMIM) to develop new imaging and metrological capabilities for studying nanoscale electronic properties. In particular, we are interested in combining time-resolved optical techniques with our microwave methods to study locally generated carriers and to study their decay and transport across heterointerfaces (p-n junctions, materials interfaces, etc). We seek a researcher to work with us to help develop new tools to study nanoscale electronic devices. Scanning probe and/or optics experience is preferred.



Microwave; Nanoscale; Scanning probe microscopy; Near-field optics;


Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants


Base Stipend Travel Allotment Supplementation
$74,950.00 $3,000.00
Copyright © 2022. National Academy of Sciences. All rights reserved.Terms of Use and Privacy Policy