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Opportunity at National Institute of Standards and Technology (NIST)

Refractive Index Properties of Bulk and Nano-scale Materials from VUV to mid-IR

Location

Physical Measurement Laboratory, Sensor Science Division

RO# Location
50.68.51.C0699 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.

Advisers

name email phone
John H. Burnett john.burnett@nist.gov 301.975.2679

Description

Research opportunities are available for a wide range of practical and basic linear and nonlinear refractive index issues. The focus is on developing new concepts and measurement methods for characterization of index of refraction properties (index dispersion, dependence on stress and temperature, birefringence, nonlinear properties, etc.), for wavelengths in the range VUV – mid IR (0.12 - 15 microns). These include: interferometric methods; optical issues, such as symmetry-breaking effects of finite momentum at short wavelengths (first measured and analyzed for practical optical materials at NIST); nonlinear effects; measurements of nano-scale materials; and a new project on the development of methods for in situ characterization of channel waveguide materials in integrated photonic structures.

Keywords:
optical properties; refractive index; birefringence; nonlinear materials; integrated photonic materials

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants

Stipend

Base Stipend Travel Allotment Supplementation
$74,950.00 $3,000.00
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