Opportunity at National Institute of Standards and Technology (NIST)
Optical Properties of Materials
Physical Measurement Laboratory, Sensor Science Division
Please note: This Agency only participates in the February and August reviews.
|John H. Burnett
|Thomas Avery Germer
|Steven E. Grantham
|Leonard M. Hanssen
|C. Cameron Miller
|Heather Jean Patrick
|Eric L. Shirley
Research opportunities are available to advance the measurement of properties of materials from the terahertz to extreme ultraviolet for applications in remote sensing, nanoscale science, microelectronics, photonics, color and appearance, medical imaging, homeland security, and defense. State-of-the-art research instruments are available for accurate measurement of such optical properties as reflectance, transmittance, scattering, emittance, and fluorescence in a variety of geometries using laser, lamp, and blackbody radiation sources. Specialized capabilities exist for light scattering ellipsometry, index of refraction, optical grating scatterometry, bidirectional optical scattering and reflectometry, polarimetry, spectroscopy, emissometry, and retroreflectometry. We are interested in efforts that develop new or improved measurement capabilities, standards, or applications.
For more information, see https://www.nist.gov/pml/sensor-science/optical-properties-materials
Reflectance; Transmittance; Spectroscopy; Optical scattering; Refractive index; Scatterometry; Fluorescence; Absorptance; Emittance; Emissivity; THz; Ellipsometry; BRDF; Polarimetry; Reflectometry; Photonics; Imaging; Refraction; Color; Appearance; Diffuse; Blackbody; Bidirectional; Spectrophotometer; Retroreflection; Terahertz; Infrared; Ultraviolet; Birefringence
Open to U.S. citizens
Open to Postdoctoral applicants