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Opportunity at National Institute of Standards and Technology (NIST)

Advanced X-ray Fundamental Parameters

Location

Physical Measurement Laboratory, Radiation Physics Division

RO# Location
50.68.21.C0736 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.

Advisers

name email phone
Csilla I Szabo-Foster csilla.szabo-foster@nist.gov 301.975.4334

Description

The first step for an x-ray fluorescence study is to establish a reliable calibration for the energy scale of the spectrum. This calibration is usually accomplished through “well-known” calibration lines tabulated in x-ray fundamental parameter’s databases. The success of the fundamental parameter method for quantitative analysis depends on the accuracy and completeness of the tabulations of the used parameters. Where do these parameters come from and how precisely are they known? Are they connected to units defined by the International System of Units (SI)? At NIST we make sure they are. We combine wavelength- and energy-dispersive X-ray methods to improve on current transition energy databases performing measurements with unparalleled precision. We use a custom, in-house constructed, high-resolution double-crystal diffraction instrument combined with a high-power, demountable x-ray source and a vacuum compatible hybrid pixel area detector. Decades of development of instrumentation for cutting edge x-ray metrology will guarantee results that provide for a wide x-ray community including collaborators developing cryogenic quantum sensors (transition edge sensors: TES) at NIST.

Keywords:
x-ray diffraction; Fundamental Parameters; x-ray metrology; silicon crystal; double-crystal spectrometer; wavelength standards; high resolution x-ray spectroscopy; x-ray transition energies; cryogenic quantum sensors; x-ray fluorescence (XRF)

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants

Stipend

Base Stipend Travel Allotment Supplementation
$74,950.00 $3,000.00
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