Opportunity at National Institute of Standards and Technology (NIST)
Enhanced X-Ray Imaging Techniques
Location
Physical Measurement Laboratory, Radiation Physics Division
| RO# |
Location |
|
| 50.68.21.B7568 |
Gaithersburg, MD |
Please note: This Agency only participates in the February and August reviews.
Advisers
| name |
email |
phone |
|
| Lawrence Thomas Hudson |
larry.hudson@nist.gov |
301.975.2537 |
Description
This project would pursue enhanced x-ray image acquisition and analysis methods that are applicable to security and medical applications of x-ray imaging as well as basic science techniques such as wavelength-dispersive spectroscopy. A variety of in-house x-ray sources and detector technologies invite efforts to optimize traditional image quality metrics and the use of algorithms and methods to extract the maximum amount of information available. These results will be used to inform x-ray standards development and will drive the technical performance of future commercial x-ray imaging systems.
References
Seely JF, et al: Applied Optics 49: 4372, 2010
Seely JF, et al: Applied Optics 47: 5753, 2008
Keywords:
X-ray imaging;
Eligibility
Citizenship:
Open to U.S. citizens
Level:
Open to Postdoctoral applicants
Stipend
| Base Stipend |
Travel Allotment |
Supplementation |
|
| $74,950.00 |
$3,000.00 |
|
|