Opportunity at National Institute of Standards and Technology (NIST)
Organic and Thin Film Electronics
Physical Measurement Laboratory, Nanoscale Device Characterization Division
||Gaithersburg, MD 20899
Please note: This Agency only participates in the February and August reviews.
|Gundlach, David James
Thin film semiconductor devices based on van der Waals bonded materials such as atomically thin crystalline 2D layered sheets, organic thin films, and organic molecular crystals present new opportunities for creating systems with physical properties and electronic/photonic functions that cannot be obtained by using any other approach. This project aspires to exploit the unique polaronic and excitonic properties of such systems to enable electronic and photonic devices with emergent quantum behavior at temperatures above 77K, and up to room temperature for future computing and sensing. Under this project we will establish device design and fabrication methods to give rise to enhanced quantum phenomena and the theory, modeling, and electrical/photonic measurement methods necessary to quantify quantum phenomena.
Polaronic and Excitonic Devices; Charge Transport; Magneto-Conductance; Magneto-Electroluminescence; Organic Semiconductors; Charge Injection; Thin Film Electronics; Room Temperature Quantum Coherence; Electrical Metrology
Open to U.S. citizens
Open to Postdoctoral applicants