Summary:
Localization microscopy has left the resolution limit in the rearview optics. However, most localization measurements are precise but inaccurate, leading to overconfidence in position data. This fundamental issue is becoming more important as localization microscopy matures, requiring not only novel methods but also reliable quantities for meaningful comparison. We lead the development of innovative standards and novel calibrations to achieve accuracy in localization microscopy [1, 2], with applications ranging from nanoplastic characterization to nanophotonic integration. Our project is collaborative and interdisciplinary, and we seek outstanding applicants with high motivation and strong backgrounds in the physical sciences.
Contact:
Thank you for your interest in this research opportunity. For more information, please email samuel.stavis@nist.gov.
References:
[1] Accurate localization microscopy by intrinsic aberration calibration, C. R. Copeland, C. D. McGray, B. Robert Ilic, J. Geist, and S. M. Stavis, Nature Communications 12, 3925 (2021).
[2] Subnanometer localization accuracy in widefield optical microscopy, C. R. Copeland, J. Geist, C. D. McGray, V. A. Aksyuk, J. A. Liddle, B. R. Ilic, and S. M. Stavis, Light: Science & Applications 7, 31 (2018).
Accuracy; Calibration; Correlative; Localization; Microscopy; Optical; Precision; Standard; Tracking