Opportunity at National Institute of Standards and Technology (NIST)
Nano- and Atomic-Resolution Electron Microscopy of Three-Dimensional Structures
Material Measurement Laboratory, Materials Measurement Science Division
Please note: This Agency only participates in the February and August reviews.
|Andrew Anthony Herzing
The modern transmission electron microscope (TEM) is capable of atomic-resolution structural and chemical imaging. However, such data typically only represents a two-dimensional (2-D) projection of the underlying physical or chemical structure. To characterize the three-dimensional (3-D) makeup of a specimen, electron tomography is often employed. This involves the computational determination of 3-D features of a specimen from a series of their 2-D projections. By carefully preparing the specimen, designing the experimental acquisition, and subsequent data processing, semi- and fully-quantitative 3-D characterization should be possible. The successful candidate should possess a strong foundation in TEM characterization. Experience with aberration-corrected electron optics and/or tomographic reconstruction techniques would be ideal, but not a prerequisite.
Herzing AA, Richter LJ, Anderson IM: Journal of Physical Chemistry C 114: 17501, 2010
Scott MC, et al: Nature 483: 444, 2012
Electron microscopy; TEM; STEM; Tomography; Nanotechnology; Nanocharacterization; EELS; EDS; HAADF;
Open to U.S. citizens
Open to Postdoctoral applicants