The National Academies Logo
Research Associateship Programs
Fellowships Office
Policy and Global Affairs

Participating Agencies - ARL/USMA

  Sign InPrintable View

Opportunity at Davies Teaching Fellowships (ARL/USMA)

Research on High-Energy-Density Dielectrics and Capacitors for Power Electronics and Pulsed Power Applications


Sensors Electron Devices Directorate-FFP, Electrochemistry and Energy Sciences - FFP

RO# Location
AA.31.09.B7056 Adelphi, MD 207831197


Name E-mail Phone
Jow, T. Richard 301.394.0340


In the current and future propulsion and more electrified systems, capacitors are essential in power electronic circuits for efficient power conditioning. In future electromagnetic based guns, protection systems and directed energy systems, capacitors are also essential for providing needed pulsed power for the operation of these systems. Current capacitors cannot meet the high-temperature, high-energy density and graceful fading that are required for the propulsion and other electrified systems. Similarly, the state-of-the-art capacitors are too bulky to fit into the platforms for most of the pulse power applications.

To meet the challenges, our work focuses on the following areas. The first area includes the identification of high-energy-density high-temperature polymeric dielectrics and the development of process for fabrication of promising dielectrics into high quality capacitor grade films. The second area, relating to conversion of the dielectric films before they are assembled into capacitors, includes the metallization and coating techniques for enhancing self-clearing, at the same time, current carrying capability. The third area involves development of novel designs and assembly methods for minimizing the field enhancement at the dielectric edge and maximizing the use of dielectrics for high-energy density and high voltage packaging for pulsed power applications. The fourth area includes the development of pulse power systems optimizing capacitors with other components such as switches and loads.



Qin SC, et al: IEEE Electrical Insulation Magazine 27(1): 1, 2011

Ho J, Jow TR, Boggs S: IEEE Electrical Insulation Magazine 26(1): 20, 2010


Dielectrics; Capacitors; Dielectric constant; Breakdown strength; Power electronics; Pulsed power;


Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants
Copyright © 2014. National Academy of Sciences. All rights reserved. 500 Fifth St. N.W., Washington, D.C. 20001.
Terms of Use and Privacy Statement.