Opportunity at National Institute of Standards and Technology (NIST)
Luminescence-based Imaging Techniques for Photovoltaics
Engineering Laboratory, Energy and Environment Division
Please note: This Agency only participates in the February and August reviews.
Research on photovoltaics focuses on the development of new and improved device characterization methods for various cell technologies and the improvement of measurement science to reduce uncertainties associated with the power rating. Furthermore, as photovoltaic cells and modules age in the field under operation, various degradation phenomena start to impact the performance of the module. Imaging techniques that provide spatially resolved analysis of various faults and defects in large-area devices are now at the forefront of research and need to be expanded and improved. Luminescence-based imaging techniques such as electroluminescence and photoluminescence have proven to be powerful methods for identifying local shunts, band gap defect states, charge carrier lifetimes and other failure modes. Furthermore, if these measurements are calibrated and performed in an absolute way, important device related quantities such as the external luminescence quantum yield and local voltage variations can be extracted from an entire image.
Imaging work is currently being performed to identify, study and correlate PV loss mechanisms, such as non-radiative recombination effects, with global device measurements. The marriage of imaging techniques with individual device measurements such as I-V curve and quantum efficiency measurements allows us to elucidate a complete picture of charge transport phenomena in photovoltaic devices. Other opportunities include temperature and illumination dependent measurements, time resolved luminescence measurements and improvements in image analysis methods by applying artificial intelligence and machine learning tools.
photovoltaics; electroluminescence; photoluminescence; imaging; device physics
Open to U.S. citizens
Open to Postdoctoral applicants