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Opportunity at National Institute of Standards and Technology (NIST)

Surface Noise Metrology

Location

Physical Measurement Laboratory, Quantum Electromagnetics Division

RO# Location
50.68.72.B8239 Boulder, CO

Please note: This Agency only participates in the February and August reviews.

Advisers

Name E-mail Phone
Hite, Dustin A dustin.hite@nist.gov 303.497.4838

Description

Many quantum devices rely on miniaturization to achieve their functionality. For example, quantum bits, whether formed with trapped ions or superconducting tunnel junctions, depend on miniaturization to meet the scalability requirement of quantum computation. However, as devices are made smaller, fluctuating surface processes, often associated with defects, begin to play a role in the device performance in the form of surface-related noise. Our research aims to develop new measurement techniques in surface science to characterize and mitigate the deleterious effects of surface noise in quantum-device applications. We have research opportunities available in developing and using new techniques to characterize dynamical surface processes, such as adsorption/desorption or surface diffusion, using state-of-the-art scanned probe microscopy (STM, AFM, and KPFM), high-resolution electron diffraction (SPA-LEED), electron spectroscopy (AES and PES), and a one-of-a-kind trapped-ion surface probe. We are looking for Associates who have skills in any area including materials, modelling, RF design, microfabrication, nanofabrication, ion trapping, and surface science.

 

Reference

Hite DA, et al: Surface science for improved ion traps, MRS Bulletin 38: 826, 2013

 

Keywords:
Surface science; STM; Kelvin probe microscopy; Ion traps; Photoemission; SPA-LEED; Anomalous heating; UHV;

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants
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