Opportunity at National Institute of Standards and Technology (NIST)
Broadband Nanoscale Probing, Material Characterization and Field Imaging, for Beyond-CMOS Electronics
Physical Measurement Laboratory, Applied Physics Division
Please note: This Agency only participates in the February and August reviews.
|Wallis, T. Mitchell
Few experimental tools are currently available that can characterize and probe high-speed/frequency properties of materials and devices on a nano/molecular scale. Proposals are invited for high-frequency noninvasive nanoscale probing and theory, including electromagnetic field imaging; as well as measurements of voltage, current, and materials properties. The objective is to develop the fundamental metrology (i.e., the instruments and standards that will make it possible to perform high-speed voltage and current measurements necessary for the characterization of high-speed, high-performance ultrahigh-density nano and molecular electronics devices). Also of interest are broadband measurements of the electromagnetic properties of nano-engineered, artificial, biological, nanowire, and carbon-nanotube-based materials and devices. Device fabrication facilities (film deposition, lithography), state-of-the-art microwave test systems and probe stations, as well as scanning electron, scanning tunneling, and atomic force microscopy facilities are available for the proposed research.
Microwave; Nanoscale; Scanning probe microscopy;
Open to U.S. citizens
Open to Postdoctoral applicants