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Opportunity at National Institute of Standards and Technology (NIST)

Infrared Detection Using Novel Materials and Devices

Location

Physical Measurement Laboratory, Sensor Science Division

RO# Location
50.68.51.C0027 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.

Advisers

Name E-mail Phone
Woods, Solomon solomon.woods@nist.gov 301-975-2382

Description

Relevant projects will employ novel materials (e.g., vertically-aligned carbon nanotubes, two-dimensional materials) or devices (e.g., transition edge sensors, superconducting nanowire single photon detectors) to expand the capabilities for infrared detection. Areas of particular interest include single photon detection at mid-infrared wavelengths, high sensitivity methods for far-infrared detection, and wide bandwidth UV-to-IR devices for absolute calibration of incident photon flux. A qualified candidate would already have expertise in at least some of the following areas: carbon nanotube device fabrication, 2D materials device fabrication, silicon nitride device fabrication, optical and e-beam lithography, FTIR spectroscopy, IR measurements, cryogenic experimental techniques, superconductivity, SQUID measurement techniques, and noise measurements.

 

References:

Tomlin NA, White M, Vayshenker I, Woods SI, Lehman JH: Planar electrical-substitution carbon nanotube cryogenic radiometer. Metrologia 52: 376, 2015

Marsili F, Verma VB, Stern JA, Harrington S, Lita AE, Gerrits T, Vayshenker I, Baek B, Shaw MD, Mirin RP, Nam SW: Detecting single infrared photons with 93% system efficiency. Nature Photonics 7: 210, 2013

Thongrattanasiri S, Koppens FHL, Garcia de Abajo FJ: Complete Optical Absorption in Periodically Patterned Graphene. Physical Review Letters 108: 047401, 2012

 

Keywords:
Single-photon detectors; Mid-IR detectors; Far-IR detectors; Carbon nanotubes; Two-dimensional materials; Graphene; Superconducting nanowires; Transition edge sensor;

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants
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