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Opportunity at National Institute of Standards and Technology (NIST)

MEM-Based Scanning Probe Microscopy

Location

Physical Measurement Laboratory, Engineering Physics Division

RO# Location
50.68.31.B7380 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.

Advisers

Name E-mail Phone
Gorman, Jason J. gorman@nist.gov 301.975.3446

Description

We are developing precision microelectromechanical systems (MEMS) to improve measurement accuracy and throughput in scanning probe microscopy (SPM), particularly for scanning tunneling microscopy (STM) and atomic force microscopy (AFM). STM and AFM have been invaluable tools in the growth of nanotechnology but are limited in measurement speed and scanning area, which has minimized their use in process control applications in the nanomanufacturing and semiconductor industries. Our research focuses on the miniaturization of SPM sensing mechanisms (e.g., active cantilevers), high-speed MEMS scanning stages, advanced motion control, and instrument system integration. Research opportunities are available in the areas of design and analysis of MEMS sensors and actuators, micro- and nanofabrication, and control system design and analysis.

Keywords:
MEMS; Microelectromechanical systems; Atomic force microscopy; Scanning tunneling microscopy; AFM; STM; Control systems; Mechanical design; Position sensors;

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants
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