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Opportunity at National Institute of Standards and Technology (NIST)

Enhanced X-Ray Imaging Techniques

Location

Physical Measurement Laboratory, Radiation Physics Division

RO# Location
50.68.21.B7568 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.

Advisers

Name E-mail Phone
Hudson, Lawrence Thomas larry.hudson@nist.gov 301.975.2537

Description

This project would pursue enhanced x-ray image acquisition and analysis methods that are applicable to security and medical applications of x-ray imaging as well as basic science techniques such as wavelength-dispersive spectroscopy. A variety of in-house x-ray sources and detector technologies invite efforts to optimize traditional image quality metrics and the use of algorithms and methods to extract the maximum amount of information available. These results will be used to inform x-ray standards development and will drive the technical performance of future commercial x-ray imaging systems.

 

References

Seely JF, et al: Applied Optics 49: 4372, 2010

Seely JF, et al: Applied Optics 47: 5753, 2008

 

Keywords:
X-ray imaging;

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants
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