Opportunity at National Institute of Standards and Technology (NIST)
Laser Cooled Atoms as a Source for Focused Ion Beams
Physical Measurement Laboratory, Nanoscale Device Characterization Division
||Gaithersburg, MD 20899
Please note: This Agency only participates in the February and August reviews.
|McClelland, Jabez J.
Focused ion beams comprise one of the most important tools for nanotechnology, enabling both imaging and machining on the nanoscale. We have developed a new approach to ion beam production that can result in higher brightness than conventional ion sources, a narrower energy spread, and an ability to be realized with a range of different ionic species. The high brightness of the source derives from the ultracold temperatures made available through laser cooling-for example, as can be achieved with a magneto-optical trap. The ionic species that can be produced range from Li+ and He+, which are ideal for ion microscopy, to Kr+ and Xe+, which are excellent candidates for contamination-free ion milling. Other ionic species include various metals, alkalis, alkaline earths, and rare-earth elements, enabling a number of new applications ranging from nanoscale stimulated ion mass spectrometry to nanoscale deterministic doping. We are pursuing applications of our first generation Li ion micrscope and also new source development based on new laser cooling technologies. Research is conducted in a fully-equipped atom optics laboratory with several dye, Ti:sapphire and diode-based single-frequency laser systems, optics hardware, atom beam systems, focused ion beam systems, and ultrahigh vacuum equipment. The work is part of an ongoing interdisciplinary nanotechnology program in the Electron Physics Group, part of the NIST Center for Nanoscale Science and Technology.
Focused ion beams; Ion microscopy; Ion optics; Laser cooling and trapping; Magneto-optical trap; Nanotechnology;
Open to U.S. citizens
Open to Postdoctoral applicants