Our goal is to develop low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope (SEM), for determining microscopic structure, defect types, and interface character in ultrathin films, nanoparticles, and nanoparticle-biological material systems. Several benefits that could significantly impact numerous areas of nanotechnology and biotechnology emerge with successful adaptation of transmission electron microscopy (TEM) concepts to the SEM. For example, compared to conventional TEM methods, lower SEM beam energies lead to increased electron scattering cross sections (resulting in increased contrast from very small volumes of material), and reduced beam-induced knock-on damage (resulting in prolonged imaging times and fewer artifacts). Research includes demonstrating diffraction, imaging, and spectroscopy methods on several nanoparticle and nano-bio material systems, modeling electron scattering in such materials, and integrating multiple characterization methods to enable simultaneous capture of different signals. Our laboratory has a field emission scanning electron microscope with an automated electron backscatter diffraction system, a 200 kV transmission electron microscope, and specimen preparation facilities.

 

key words

Electron backscatter diffraction; Electron microscopy; Nano-biotechnology; Nanoparticles; Nanotechnology; SEM; TEM-in-SEM;

Citizenship:  Open to U.S. citizens

Level:  Open to Postdoctoral applicants