Opportunity at National Institute of Standards and Technology (NIST)
Reliability at Complex Interfaces
Material Measurement Laboratory, Applied Chemicals and Materials Division
Please note: This Agency only participates in the February and August reviews.
|DelRio, Frank William
In many new and emerging applications ranging from opto- and microelectronics to biotechnology, components incorporate increasingly complex interfaces that dictate device performance and reliability. New measurement methods are needed for probing the effects of such interfaces on mechanical behavior and defect evolution, as well as relating these properties to spatial variations in device performance. Proposals are sought that involve characterization of interface reliability issues and evaluation of related surface and sub-surface effects. Desired proposals will include new methods for characterizing complex interfaces, extension of existing tools for improved sensitivity and spatial resolution, and comprehensive characterization of specific materials and next-generation devices (e.g., photovoltaics, batteries, nanocomposites). Current research primarily involves techniques based on atomic force microscopy (AFM), but opportunities exist involving complementary tools such as instrumented (nano-) indentation, SEM, TEM, and optical methods.
AFM; Biomaterials; Composites; Defects; Interfaces; Mechanical properties; Mechanics; Multilayer devices; Nanotechnology;
Open to U.S. citizens
Open to Postdoctoral applicants