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Opportunity at National Institute of Standards and Technology (NIST)

Development of Nuclear Analytical Imaging Techniques for Materials Analysis with Spatial and Spectral Specificity

Location

Material Measurement Laboratory, Chemical Sciences Division

RO# Location
50.64.61.B8477 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.

Advisers

Name E-mail Phone
Chen-Mayer, Huaiyu Heather chen-mayer@nist.gov 301.975.5595

Description

The objective of this research is to develop new measurement capabilities for nuclear analytical techniques associated with the measurement of induced charged particle and/or gamma ray emissions during thermal and cold neutron beam irradiation. Nondestructive methods such as Neutron Depth Profiling (NDP) and Prompt Gamma Activation Analysis (PGAA) are well suited for applications in Li ion battery in-situ studies (NDP) and multi-elemental analysis (PGAA). The research will explore imaging of the induced charged particle and gamma ray emission, and develop image reconstruction techniques to obtain spatial distribution of the elemental composition based on spectral analysis of the emitted radiation. Much of the effort will be dedicated to developing and applying detection systems suitable for charged particle and spectral gamma ray imaging during neutron beam irradiation. The research is conducted at two neutron beam instruments at the NIST Center for Neutron Research (NCNR).

 

References

Shrikant C, et al: Neutron depth profiling technique for studying aging in Li-ion batteries. Electrochimica Acta 56(13): 4735-4743, 2011

Paul RL, et al: NGD cold-neutron prompt gamma-ray activation analysis spectrometer at NIST. Journal of Radioanalytical and Nuclear Chemistry 304(1): 189-193, 2015

Polf JC, Parodi K: Imaging particle beams for cancer treatment. Physics Today 68(10): 28-33, 2015

 

Keywords:
Charged particle imaging; Gamma ray imaging; Neutron activation analysis; Composition analysis; Prompt gamma activation analysis; Elemental analysis; Non-destructive analysis;

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants
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