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Opportunity at National Institute of Standards and Technology (NIST)

Synchrotron Methods: Extended X-Ray Absorption Fine Structure


Material Measurement Laboratory, Materials Measurement Science Division/Brookhaven Lab

RO# Location
50.64.35.B6768 Upton, NY 11973

Please note: This Agency only participates in the February and August reviews.


Name E-mail Phone
Fischer, Daniel A. 631.344.5177
Ravel, Bruce 631.344.3613
Woicik, Joseph Cestone 631-344-4247


We have developed state-of-the-art synchrotron based extended x-ray absorption fine structure (EXAFS) measurements to enable the development and optimization of materials for electronics, photonics, energy conversion, sustainable energy, catalysis, and sensing applications. Materials that can be investigated include monolayers to bulk materials of all classes. Examples of ongoing measurement studies include (1) the bonding chemistry and local atomic structure of ferroelectric perovskites, (2) strain dependent electronic phase transitions, (3) chemistry and bonding at semiconductor oxide interfaces, (4) dopant activation, (5) high-k gate dielectrics, and (6) phase change materials. Such measurement studies offer the opportunity to develop and utilize world class x-ray instrumentation and detectors. Opportunities exist for the application of EXAFS to other advanced materials, including nanomaterials, for myriad applications.


Catalysis; Chemistry; Electronic devices; Energy conversion; EXAFS; Interfaces; Local atomic structure; Nanomaterials; Photonic devices; Sensors; Sustainable energy; Synchrotron radiation; X-ray absorption;


Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants


Base Stipend Travel Allotment Supplementation
$72,750.00 $3,000.00
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