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Opportunity at National Institute of Standards and Technology (NIST)

Spatially-resolved Elemental Analysis

Location

Material Measurement Laboratory, Materials Measurement Science Division

RO# Location
50.64.31.C0051 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.

Advisers

Name E-mail Phone
Newbury, Dale E. dale.newbury@nist.gov 301.975.3921

Description

We develop measurement techniques for quantitative spatially-resolved elemental analysis based upon a variety of techniques, including electron and photon excitation with energy dispersive X-ray spectrometry (EDS). One instrument of particular interest is the "Micro X-ray Fluorescence Analyzer (µ-XRF)" which uses an excitation beam of characteristic and continuum X-rays with EDS X-ray detection. Software development will be an important part of this effort, building upon the platform "DTSA-II" Platform (developed by Nicholas Ritchie) for electron excitation (available free at www.nist.gov; search "DTSA-II").

 

Keywords:
Analytical chemistry; Elemental analysis; Materials characterization; Microanalysis; Quantitative analysis; X-ray fluorescence analysis;

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants
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