Opportunity at National Institute of Standards and Technology (NIST)
Spatially-resolved Elemental Analysis
Material Measurement Laboratory, Materials Measurement Science Division
Please note: This Agency only participates in the February and August reviews.
|Newbury, Dale E.
We develop measurement techniques for quantitative spatially-resolved elemental analysis based upon a variety of techniques, including electron and photon excitation with energy dispersive X-ray spectrometry (EDS). One instrument of particular interest is the "Micro X-ray Fluorescence Analyzer (µ-XRF)" which uses an excitation beam of characteristic and continuum X-rays with EDS X-ray detection. Software development will be an important part of this effort, building upon the platform "DTSA-II" Platform (developed by Nicholas Ritchie) for electron excitation (available free at www.nist.gov; search "DTSA-II").
Analytical chemistry; Elemental analysis; Materials characterization; Microanalysis; Quantitative analysis; X-ray fluorescence analysis;
Open to U.S. citizens
Open to Postdoctoral applicants