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Opportunity at National Institute of Standards and Technology (NIST)

Nano- and Atomic-Resolution Electron Microscopy of Three-Dimensional Structures


Material Measurement Laboratory, Materials Measurement Science Division

RO# Location
50.64.31.B7958 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.


Name E-mail Phone
Herzing, Andrew Anthony 301.975.2860


The modern transmission electron microscope (TEM) is capable of atomic-resolution structural and chemical imaging. However, such data typically only represents a two-dimensional (2-D) projection of the underlying physical or chemical structure. To characterize the three-dimensional (3-D) makeup of a specimen, electron tomography is often employed. This involves the computational determination of 3-D features of a specimen from a series of their 2-D projections. By carefully preparing the specimen, designing the experimental acquisition, and subsequent data processing, semi- and fully-quantitative 3-D characterization should be possible. The successful candidate should possess a strong foundation in TEM characterization. Experience with aberration-corrected electron optics and/or tomographic reconstruction techniques would be ideal, but not a prerequisite.



Herzing AA, Richter LJ, Anderson IM: Journal of Physical Chemistry C 114: 17501, 2010

Scott MC, et al: Nature 483: 444, 2012


Electron microscopy; TEM; STEM; Tomography; Nanotechnology; Nanocharacterization; EELS; EDS; HAADF;


Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants
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