Opportunity at National Institute of Standards and Technology (NIST)
Unraveling Local Structure (Atomic to Nanometer Scale)
Material Measurement Laboratory, Materials Measurement Science Division
Please note: This Agency only participates in the February and August reviews.
Emerging electronic oxides (e.g. dielectrics, ferroelectrics, solid-state ionic conductors) frequently exhibit local atomic arrangements that are significantly different from those described by the average atomic positions as inferred from traditional crystallographic metrologies. The critical properties of these materials are strongly influenced by details of their local structure. While numerous methods exist for probing such short-range structural fluctuations, no single technique provides sufficient information to define a unique structural solution. Therefore, we concentrate on developing a coherent strategy for a comprehensive determination of local structure using combined inputs from multiple experimental methods and theory. The research includes experimental measurements on selected industrially-pertinent materials using a range of advanced techniques (transmission electron microscopy, x-ray and neutron diffraction, x-ray absorption fine structure, and Raman spectroscopy), development of data analysis approaches and computer software for simultaneous structural refinements using multiple types of data, and ab initio theoretical modeling of local structures and Raman spectra.
Ab initio theoretical modeling; Active nanodevices; Atomic scale; Electronic materials; Local structure; Nanometer scale; Pair-distribution function; Raman spectroscopy; Solid-state ionics; X-ray absorption spectroscopy;
Open to U.S. citizens
Open to Postdoctoral applicants