Name |
E-mail |
Phone |
|
Borchers, Julie A. |
julie.borchers@nist.gov |
301.975.6597 |
Dura, Joseph A. |
joseph.dura@nist.gov |
301.975.6251 |
Grutter, Alexander |
alexander.grutter@nist.gov |
301-975-4198 |
Kirby, Brian J |
bkirby@nist.gov |
301.975.8395 |
Majkrzak, Charles F. |
charles.majkrzak@nist.gov |
301.975.5251 |
Satija, Sushil K. |
sushil.satija@nist.gov |
301.975.5250 |
We use neutron reflectometry to study a variety of fundamental physical and chemical phenomena at solid-solid, liquid-liquid, solid-liquid, and solid- or liquid-gas interfaces. By measuring the specular reflectivity as a function of glancing angle, we can determine both chemical and magnetic density profiles normal to the surface. We can also measure nonspecular scattering, from which we can derive in-plane information. Systems of interest include polymer films, magnetic thin films and multilayered structures (using polarized beams), superconducting films (magnetic penetration depth measurements), lipid bilayers, Langmuir-Blodgett films, metal hydride films, and electrochemical surfaces (in situ studies in active cells).